Dr. Ines Stassen Böhlen
Dr. Ines Stassen Böhlen
ZHAW
School of Engineering
Forschungsschwerpunkt Wissenschaftliches Rechnen & Algorithmik
Technikumstrasse 71
8400 Winterthur
Publikationen
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Boehlen, Karl L.; Stassen Böhlen, Ines B.; Allott, Ric M.,
2005.
Advanced laser micro-structuring of super-large-area optical films [Paper].
In:
Micromachining Technology for Micro-Optics and Nano-Optics III.
MOEMS-MEMS Micro and Nanofabrication, San Jose, United States, 22-27 January 2005.
International society for optical engineering.
S. 204-212.
Verfügbar unter: https://doi.org/10.1117/12.599396
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Böhlen, Karl L.; Stassen Böhlen, Ines B.,
2004.
Laser micromachining of high-density optical structures on large substrates [Paper].
In:
Photon Processing in Microelectronics and Photonics III.
Lasers and Applications in Science and Engineering, San Jose, USA, 25-29 January 2004.
International society for optical engineering.
S. 118-127.
Verfügbar unter: https://doi.org/10.1117/12.537827
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Stassen Böhlen, Ines; Fieret, Jim; Holmes, Andrew S.; Lee, Kin W.,
2003.
CAD/CAM software for an industrial laser manufacturing tool [Paper].
In:
Photon Processing in Microelectronics and Photonics II.
High-Power Lasers and Applications, San Jose, USA, 25-31 January 2003.
International society for optical engineering.
S. 198-207.
Verfügbar unter: https://doi.org/10.1117/12.479533
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Leisten, Oliver; Fieret, Jim; Stassen Böhlen, Ines; Rumsby, Phil T.; McEvoy, Patrick; Vardaxoglou, Yiannis,
2002.
In:
Photon Processing in Microelectronics and Photonics.
High-Power Lasers and Applications, San Jose, United States, 20-25 January 2002.
International society for optical engineering.
S. 397-404.
Verfügbar unter: https://doi.org/10.1117/12.470647
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Abbott, Charles; Allott, Ric M.; Bann, Bob; Boehlen, Karl L.; Gower, Malcolm C.; Rumsby, Phil T.; Stassen Böhlen, Ines; Sykes, Neil,
2002.
New techniques for laser micromachining MEMS devices [Paper].
In:
High-Power Laser Ablation IV.
International Symposium on High-Power Laser Ablation 2002, Taos, USA, 21-26 April 2002.
International society for optical engineering.
S. 281-289.
Verfügbar unter: https://doi.org/10.1117/12.482096