- Scanning electron microscopy (VP-SEM, combined with EDXS)
- Atomic force microscopy (AFM, temperature range: RT to 100 °C)
- X-ray photoelectron spectroscopy (XPS)
- Auger spectroscopy (SAM)
- 3D microscopy (confocal and interferometric)
- IR and Raman scanning microscopy
- Correlative microscopy: light, 3D, SEM/EDS, SAM/XPS, AFM, IR, Raman
- Angle dependent UV/VIS/NIR measurements in reflection and transmission
- Diffuse absorption spectroscopy and reflection spectroscopy
- Colorimetry
- ATR infrared spectroscopy
- Contact angle determination, surface tension/-energy
- Physisorption, chemisorption (TPO, TPR, TPD)
- X-ray diffraction analysis (XRD, temperature range: RT to 1600° C)
- Metallography and ceramography
- High temperature tribology (oscillating, temperature range: RT to 900 °C)
- Pin-on-disk tribology
- Trace element analysis (ICP-OES)
- Spectroscopy (UV/VIS NRI, FTR, fluorescence)
- Process analytics in condensed (IR) and gas phase (RAMAN, MS)
- Titration methods (e.g. water content determination)
- Chromatography (GC-MS, HPLC, IC, sulfur on-line)
- Electrochemical workstation
- Electrochemical impedance